Conductive Anodic Filament (CAF) Testing
Gen3 Systems introduces the next generation of Conductive Anodic Filament Monitoring equipment used to measure the influences of sub-surface electro-chemical reactions. The AutoCAF2™ is capable to measure up to 256 individual measurement sites under conditions of high humidity and temperature in accordance with IPC-TM-650 Test Method 2.6.25 andIPC-9691 CAF Test Users Guide.
Conductive Anodic Filament (CAF) failure is copper corrosion within a printed board. It is electro-migration of the copper from Anode to Cathode between two conductors of different potential, whereas growth from Cathode to Anode is a dendrite. The combination of bias-voltage and elevated humidity initiates CAF failures. Electrical failure results when a filament grows between intended electrically isolated nets. Refer to IPC-9691 for additional information on Conductive Anodic Filament (CAF).
The newest AutoCAF2™ was developed in conjunction with a major CAF research project conducted by the British National Physical Laboratories (NPL).