Surface Insulation Resistance (SIR) Testing
Gen3 Systems introduces the next generation of test equipment used to measure the changes in Surface Insulation Resistance.
The new AutoSIR2™ system represents significant improvements over existing SIR test alternatives, and its shielded precision electronics provides State-of-the-Art resistance measurement accuracy to be made up to 1014 Ω.
One AutoSIR2™ chassis can accommodate between 1-16 measurement cards and monitor up to 256 x 2-point test patterns, 78 x 5-point test patterns, or 32 x 9-point test patterns at programmable intervals from several minutes to days. Additionally, each test channel is current limited (1 M Ω), ensuring that dendrites not are preserved (not destroyed) for subsequent failure analysis. The frequency of monitoring capability provides a full scope of the electrochemical reactions occurring on a circuit assembly and provides trend analysis enabling tests to be shortened, thereby saving considerable test time and cost.